About the Book: X-Ray Spectroscopy
This book consists of selected chapters on the recent applications of x-ray
spectroscopy that are of great interest to the scientists and engineers working
in the fields of material science, physics, chemistry, astrophysics,
astrochemistry, instrumentation, and techniques of x-ray based characterization.
The book covers some basic principles of satellite x-rays as characterization
tools for chemical properties and the physics of detectors and x-ray
spectrometer. The techniques like EDXRF, WDXRF, EPMA, satellites, micro-beam
analysis, particle induced XRF, and matrix effects are discussed. The
characterization of thin films and ceramic materials using x-rays is also
covered.
The chapters have been grouped into two major sections