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Speckle Metrology
by Rajpal S Sirohi (Author),
Marcel Dekker Inc (Publisher)
Product Specifications
Book Description
This practical reference offers state-of-the-art coverage of speckle metrology
and its value as a measuring technique in industry.;Examing every important
aspect of the field, Speckle Metrology: surveys the origin of speckle
displacement and decorrelation; presents procedures for deformation analysis and
shape measurement of rough objects; explains particle image velocimetry (PIV),
the processing of PIV records, and the design requirements of PIV equipment;
discusses the applications of white light speckle methods and the production of
artificial speckles; describes the measurement of surface roughness with laser
speckles and polychromatic speckles; illustrates semiautomatic and automatic
methods for the analysis of Young's fringes; calculates the variation of Young's
fringes with the change in
Book Specifications
ISBN-13 9780824789329
Language English
Binding Hard Bound
Publisher Marcel Dekker Inc
Publishing Date 1993-05-20
Product Edition 1