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Applied Scanning Probe Methods XII: Characterization
by Bharat Bhushan, Harald Fuchs (Author),
Springer (Publisher)
Product Specifications
Book Description
The volumes XI, XII and XIII examine the physical and technical foundation for
recent progress in applied scanning probe techniques. The first volume came out
in January 2004, the second to fourth volumes in early 2006 and the fifth to
seventh volumes in late 2006. The field is progressing so fast that there is a
need for a set of volumes every 12 to 18 months to capture latest developments.
These volumes constitute a timely comprehensive overview of SPM applications.
After introducing scanning probe microscopy, including sensor technology and tip
characterization, chapters on use in various industrial applications are
presented. Industrial applications span topographic and dynamical
Book Specifications
ISBN-13 9783540850380
Language English
Binding Hard Bound
Publisher Springer
Publishing Date 2008-11-04