"Advances in Imaging and Electron Physics" merges two long-running
serials--"Advances in Electronics and Electron Physics" and "Advances in Optical
and Electron Microscopy." This series features extended articles on the physics
of electron devices (especially semiconductor devices), particle optics at high
and low energies, microlithography, image science and digital image processing,
electromagnetic wave propagation, electron microscopy, and the computing methods
used in all these domains.
Updated with contributions from leading international scholars and industry
experts Discusses hot topic areas and presents current and future research
trends Provides an invaluable reference and guide for physicists, engineers and
mathematicians