Advances in Imaging and Electron Physics merges two long-running
serials-Advances in Electronics and Electron Physics and Advances in Optical and
Electron Microscopy. This series features extended articles on the physics of
electron devices (especially semiconductor devices), particle optics at high and
low energies, microlithography, image science and digital image processing,
electromagnetic wave propagation, electron microscopy, and the computing methods
used in all these domains.